IoT-Enabled Crop Yield Prediction Using Machine Learning Techniques

M. Sandhya Devi; Sheela Petta; K. Divya Harshitha; S. Sairam Teja; K. Nikhil Satya Devi Santosh

doi:10.59256/indjcst.20260501C022

Research Article

IoT-Enabled Crop Yield Prediction Using Machine Learning Techniques

ICCAIS-2026
Volume 5, Issue 1
Pages 135-139
Published Online: 2026

Open Access Peer Reviewed Crossref DOI

Authors

M. Sandhya Devi¹
Sheela Petta²
K. Divya Harshitha³
S. Sairam Teja⁴
K. Nikhil Satya Devi Santosh⁵

¹ ³ ⁴ ⁵ Department of Artificial Intelligence and Machine Learning, Sasi Institute of Technology and Engineering Tadepalligudem, Andhra Pradesh, India. ² Associate Professor, Department of Artificial Intelligence and Machine Learning, Sasi Institute of Technology and Engineering Tadepalligudem, Andhra Pradesh, India.

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DOI: https://www.doi.org/10.59256/indjcst.20260501C022
Conference: International Conference on Cyber and AI Security
Organised By: Madanapalle Institute of Technology & Science (MITS)
Conference Date: 9 & 10 March 2026
Pages: 135-139
Article Type: Research Article
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IoT-Enabled Crop Yield Prediction Using Machine Learning Techniques

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